Fabricating Buffer Layers for YBa_2Cu_3O_y Coated Conductor by Surface Oxidation Epitaxy  被引量:2

Fabricating Buffer Layers for YBa_2Cu_3O_y Coated Conductor by Surface Oxidation Epitaxy

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作  者:杨坚 刘慧舟 古宏伟 屈飞 范红雁 

机构地区:[1]Superconducting Materials Research Center , General Research Institute for Non-Ferrous Metals , Beijing100088 , China [2]Research and Development Department , General Research Institute for Non-Ferrous Metals ,Beijing 100088 , China

出  处:《Journal of Rare Earths》2005年第4期514-516,共3页稀土学报(英文版)

基  金:Project supported by National 863 Programof Ministry of Science and Technology of China (2002AA306211 ,2004AA306130)

摘  要:NiO buffer layers were formed on a tape of Ni for making YBCO coated conductor by surface-oxidation epitaxy (SOE) process. Different oxidizing conditions such as temperature and duration were studied for Ni tapes. It is found that the texture of NiO could be affected directly by the orientation and surface of substrate. X-ray diffraction (XRD) 2-2θ scan, φ-scan, and pole figure were employed to characterize the in-plane alignment and cube texture. X-ray φ-scan shows that NiO film is formed on Ni tape with high cube texture and a typical value at the full width at half maximum (FWHM) is ≤ 7.5°. Scanning electron microscopy was used to study the surface morphology of NiO films. No crack is found and the films appear dense. Such technique is simple and of low cost with perfect reproducibility, promising for developing long tapes.NiO buffer layers were formed on a tape of Ni for making YBCO coated conductor by surface-oxidation epitaxy (SOE) process. Different oxidizing conditions such as temperature and duration were studied for Ni tapes. It is found that the texture of NiO could be affected directly by the orientation and surface of substrate. X-ray diffraction (XRD) 2-2θ scan, φ-scan, and pole figure were employed to characterize the in-plane alignment and cube texture. X-ray φ-scan shows that NiO film is formed on Ni tape with high cube texture and a typical value at the full width at half maximum (FWHM) is ≤ 7.5°. Scanning electron microscopy was used to study the surface morphology of NiO films. No crack is found and the films appear dense. Such technique is simple and of low cost with perfect reproducibility, promising for developing long tapes.

关 键 词:metal material cube texture surface-oxidation epitaxy NiO buffer layer rare earths 

分 类 号:TG174[金属学及工艺—金属表面处理]

 

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