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作 者:葛愉成
机构地区:[1]Department of Technical Physics, Peking University, Beijing 100871
出 处:《Chinese Physics Letters》2006年第1期143-146,共4页中国物理快报(英文版)
摘 要:A laser phase determination method and a transfer function that includes a proportional term of a measured photoelectron energy spectrum are presented to directly measure the detailed temporal structure of a narrow bandwidth attosecond extreme-ultraviolet (EUV) pulse. The method is based on the spectrum measurement of an electron generated by EUV photo-ionization interacting with a femtosecond laser field. The results of the study suggest that measurements should be taken at 0° or 180° with respect to the linear laser polarization. The method has a temporal measurement range of about half a laser oscillation period. The temporal resolution also depends on the jitter and control precision of the laser and EUV pulses.A laser phase determination method and a transfer function that includes a proportional term of a measured photoelectron energy spectrum are presented to directly measure the detailed temporal structure of a narrow bandwidth attosecond extreme-ultraviolet (EUV) pulse. The method is based on the spectrum measurement of an electron generated by EUV photo-ionization interacting with a femtosecond laser field. The results of the study suggest that measurements should be taken at 0° or 180° with respect to the linear laser polarization. The method has a temporal measurement range of about half a laser oscillation period. The temporal resolution also depends on the jitter and control precision of the laser and EUV pulses.
关 键 词:ABOVE-THRESHOLD IONIZATION HARMONIC-GENERATION X-RAY FREQUENCY INTENSITY PROFILES LIMIT
分 类 号:TN24[电子电信—物理电子学] O432.12[机械工程—光学工程]
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