基于多CCD拼接相机测角精度检测  

Precision Measurement of Multi-chip CCDs System in Goniometer

作　　者：王喜军[1] 王军[2] 杨会玲[3] 何昕[2] 魏仲慧[2] 

机构地区：[1]石家庄军械工程学院,石家庄050003 [2]中国科学院长春光学精密机械与物理研究所,长春130022 [3]长春理工大学,长春130022

出　　处：《长春理工大学学报（自然科学版）》2005年第4期36-38,共3页Journal of Changchun University of Science and Technology(Natural Science Edition)

基　　金：中科院长春光学精密机械与物理研究所青年基金

摘　　要：在研制大视场、高精度光电测量设备过程中,采用多块CCD拼接技术是重要手段之一。,在分析多CCD拼接相机结构理论基础上,提出了多CCD拼接相机系统测角精度检测方法。实验结果表明,利用该检测方法与修正方法能够显著提高该系统测量精度,该方法可行且对其它光电测量设备有参考价值。Multi- chip CCD butting is an important approach in implementation of optical instruments with wide field of view and accurate precision. Based on the theory of the Multi - chip CCD butting system, How this measurement method in goniometer can be checked and corrected are particularly discussed. Actual inspection shows the ways mentioned above can correct the miss distance measurement error of the Multi - chip CCD butting system and improve the accuracy of the optical system. And it is suit for other optical system.

关 键 词：CCD拼接 单心球面系统 经纬仪 

分 类 号：TH741.23[机械工程—光学工程]