金属化膜脉冲电容器可靠性研究  

Reliability Study of Metallized Film Pulse Capacitors

作　　者：赵建印[1] 彭宝华[1] 孙权[1] 周经伦[1] 

机构地区：[1]国防科学技术大学信息系统与管理学院系统工程系,长沙410073

出　　处：《电子器件》2005年第4期703-705,709,共4页Chinese Journal of Electron Devices

基　　金：国家863计划项目资助课题(2004AA845023)

摘　　要：高储能密度金属化膜脉冲电容器是一种高可靠性、长寿命的器件,在短时间内很难得到它的失效数据,因此无法采用基于失效数据分析的传统可靠性分析方法来研究其可靠性。金属化膜脉冲电容器的失效是退化型失效,根据其失效机理,给出了电容器容值退化失效模型,依据该模型和电容器的容值退化数据,对该型电容器进行了可靠性研究,该型电容器的平均寿命为21165次充放电,其第10000次充放电时的可靠度为0.9454。在工程实践中使用该模型对该型电容器进行可靠性分析可以节约大量的试验成本。For the high reliability capacitors, it is difficult to assess the reliability by using the traditional tlme-to-failure analysis method. By analyzing degradation mechanism of the metallized film capacitors, a degradation failure model of metallized film pulse capacitors is presents. The reliability analysis basing this model is demonstrated and validated by the test data of metallized film capacitors. According to the reliability model, the probability of the capacitors that are survive to 10000 shot is 0. 9454, the predicted lifetime of the capacitors is 21165（shot）. This technique can not only assess and verify reliability level of the capacitors but also save tests cost.

关 键 词：可靠性 退化失效 金属化膜脉冲电容器 惯性约束聚变 激光装置 

分 类 号：TB114.3[理学—概率论与数理统计]