“电子背散射衍射分析方法通则”标准  

The standard-guideline for eletron backscattered diffraction analysis

作　　者：陈家光[1] 范朝晖[1] 林良道[1] 

机构地区：[1]上海宝钢股份公司研究院,上海201900

出　　处：《中国体视学与图像分析》2005年第4期250-252,共3页Chinese Journal of Stereology and Image Analysis

摘　　要：本文扼要介绍我国及国际微束分析标准化组织,我国“电子背散射衍射分析方法通则”国家标准(GB/T19501-2004)概况、以及基于该标准由我国主导起草并经ISO批准立项的“电子背散射衍射分析方法通则”(ISO/WD 24173)目前的进展。This paper briefly introduces the national organization and the International Organization for Standardization （ISO） on Microbeam Analysis. The national standard Guideline for Electron Backscattered Diffraction Analysis （GB/T19501-2004） is also recommended as well as the working draft of the future international standard Guideline for Electron which is based on this national standard and was Backscattered Diffraction Analysis （ISO/WD 24173 ） formally permitted to carry on by ISO in 2005.

关 键 词：EBSD 标准化 微束分析 电子背散射衍射分析方法 

分 类 号：TN01[电子电信—物理电子学]