确定断裂表面晶体学取向的电子背散射衍射方法  

Method for determining crystal orientation of fracture facet using electron back-scattering diffraction

作　　者：谢季佳[1] 上官丰收[1] 武晓雷[1] 洪友士[1] 

机构地区：[1]中国科学院力学研究所非线性力学国家重点实验室,北京100080

出　　处：《电子显微学报》2005年第6期547-550,共4页Journal of Chinese Electron Microscopy Society

摘　　要：利用扫描电镜中带多自由度的样品台和电子背散射衍射系统(EBSD)研究了断口的晶体学定向方法。对于镍拉伸变形后的沿晶断裂表面,利用EBSD确定了晶粒与样品坐标之间的晶体学取向关系,通过样品台倾转获得断裂面与样品之间的几何对应关系,从而定出样品沿晶断裂面主要的晶体学位向是{100}。A method was proposed to characterize the crystallographic orientation of fracture surface facets in a scanning electron microscope. Firstly, the orientation of grain abutted on the facet was measured relative to the reference axes in Ni sample after tensile testing using electron back-scattering diffraction analysis. Secondly, the inclination of the facet with respect to the same reference axes was determined by using double-tilting stage. Finally, the direction of fracture facet of Ni tension sample was obtained to be {100} .

关 键 词：晶体定向 电子背散射衍射 断裂面 

分 类 号：O72[理学—晶体学]