理想导体表面电磁散射的高阶微扰解  

High-Order Small Perturbation Method for Perfectly Conducting Rough Surface

作　　者：黄泽贵[1] 童创明[1] 胡国平[1] 常广才[2] 

机构地区：[1]空军工程大学导弹学院,陕西三原713800 [2]陕西电视台,陕西西安710016

出　　处：《上海航天》2005年第6期8-12,共5页Aerospace Shanghai

摘　　要：针对经典微扰法(SPM)求解粗糙表面电磁散射特性存在的问题,提出了一种基于二维表面场的一阶和二阶展开近似高阶微扰算法。用该法计算了高阶表面场分量的全极化后向散射SPM解和二阶场分量对水平极化双站及后向散射系数的修正解。研究了不同粗糙度下掠入射时高阶SPM求解的双站散射系数,以及不同方位角下高阶场量的散射特性。通过对合成场的修正,解决了近掠入射条件下散射系数计算的误差。数值计算结果证明该算法有效。To solve the problem in electromagnetic scattering calculation by classical small perturbation method （SPM）, a new high-order SPM was put forward based on first-order and second-order expansion approximation of 2- dimensional surface electric field in this paper. The full polarized back.scattering coefficient of high-order surface electric field and horizontal polarized backscattering coefficient correction of second-order electric field were computed by this new method. The bistatic scattering coefficient solved in grazing incident for various surface roughness by high-order SPM and scattering characteristic of high-order deetric field in different azimuth angle were discussed. The error in scattering coefficient calculation in low-grazing incident was corrected by modification of electric field integration. The numerical computation results showed that the method in this paper was effective.

关 键 词：理想导体 粗糙表面 散射系数 高阶微扰法 近掠入射 

分 类 号：O411[理学—理论物理]