真随机数发生器的容差分析  

Tolerance Analysis of Truly Random Number Generator

作　　者：叶世芬[1] 李晓明[1] 沈海斌[1] 

机构地区：[1]浙江大学超大规模集成电路设计研究所,浙江杭州310027

出　　处：《江南大学学报（自然科学版）》2005年第6期560-564,共5页Joural of Jiangnan University (Natural Science Edition)　

基　　金：国家863计划项目(2003AA141050;2003AA1Z10060)资助课题

摘　　要：基于混沌、均匀分布的真随机数发生器的工作电路和精度要求较高的电压参考电路的温度漂移进行分析,给出了仿真得到的温度曲线;分析了工艺中可能存在的问题和温度的影响与运放的共模电压和输出电压幅度,以及与混沌公式直接相关的开关电容等,根据最坏分析得到混沌公式,给出了仿真测试结果.器件的温度漂移分析是在军用芯片要求-40～105℃进行的.The tolerance of the truly random number generator circuit is discussed in the article. The circuit is based on chaos and generates random number sequence that distributes uniformly. The article analyzes temperature drift of the reference voltage circuit that is highest precision required in the system, and shows its temperature curve after SPICE simulation. Then, the paper analyzes common-mode voltage and output voltage range of operational amplifier influenced by temperature and process problems that may appear. At last, switched-capacitor circuit related with chaotic expression directly is analyzed, and the simulation result according to the worst-case chaotic expression is obtained. Analysis temperature is between -40 °C and 105 °C as required in the military use.

关 键 词：混沌 容差 共模 级联 

分 类 号：TN402[电子电信—微电子学与固体电子学]