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作 者:王家军[1] 杨志刚[1] 李春明[1] 郑燕康[1] 方鸿生[1]
出 处:《清华大学学报(自然科学版)》1996年第6期15-19,共5页Journal of Tsinghua University(Science and Technology)
摘 要:用扫描隧道显微镜(STM)观察了Cr12合金中(CrFe)7C3碳化物的精细结构,证实其晶粒内部存在层错亚结构;并发现同一晶粒内存在几个沿不同位向排列的平行层错群,不同平行群间呈约90°夹角。STM图象的快速Fourier变换(FFT)及逆变换(IFFT)结果表明,层错排列具有一定周期性。实验测得层错面间距为 50 nm。The intra-grain fine structure of (CrFe)7C3 carbide in an Fe-Cr-C alloy has been studied by scanning tunneling microscopy (STM ). It proves that a carbide grain is substructurally stacking faulted. It was also discovered that there are several parallel sheaves of stacking faults located in one carbide grain which lie at angle of about 90° with each other. Fast Fourier transformation (FFT) and inverse fast Fourier transformation (IFFT) further show the periodicity of stacking faults. The interspacing between two adjacent sheaves of stacking faults is determined to be about 50 nm.
分 类 号:TG142.33[一般工业技术—材料科学与工程]
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