片上电感的研究  

An investigation on chip inductors

作　　者：潘武[1] 赵伟[1] 

机构地区：[1]重庆邮电学院微光机电系统研究所,重庆400065

出　　处：《重庆邮电学院学报（自然科学版）》2006年第1期17-21,共5页Journal of Chongqing University of Posts and Telecommunications(Natural Sciences Edition)

基　　金：重庆市教委科学技术项目(020508)

摘　　要：片上电感是射频集成电路中必不可少的元件。通过讨论了影响电感品质因数恶化的因素,如趋肤效应、邻近效应和涡流损耗等,对片上电感的单П和双П集总参数模型进行了分析比较,分析了多种优化方案,并提出了提高片上电感Q值的研究方向。Chip inductors are critical components in radio frequency integrated circuits （RFICs）. Some reasons that lead to poor Q, such as skin effects, proximity effects and eddy current loss etc are discussed in this paper. In addition, the authors analyse and compare both single П and 2Пlumped element equivalent circuit model. Finally, optimized methods and perspectives for the development of chip inductors are presented.

关 键 词：射频集成电路 片上电感 邻近效应 趋肤效应 涡流损耗 

分 类 号：TN622[电子电信—电路与系统]