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机构地区:[1]西安交通大学
出 处:《电工技术学报》1996年第5期36-39,共4页Transactions of China Electrotechnical Society
摘 要:检验了Ibrahim和Abou-Seada等人分别给出的半球头棒-平板间隙轴线电场强度计算式,发现他们的拟合式并不合理。利用模拟电荷方法(CSM)对这种间隙进行了数值计算,并利用数据拟合方法给出1≤d/r≤500范围内的半球头棒-平板间隙轴线电场强度和电场不均匀系数近似计算式。This paper has examined the expressions of the electric field distribution along the gap axis in hemispherically-capped rod-plane galas derived by Ibrahim and Abou-Seada et al. It is shown that their expressions are not reasonable. A charge simulation method has been used for the electric field computation of this electrode configuration, and by using curve-fitting technique a new expression for calculating the electric field along gap axis and a set of expressions for calculation of the field non-uniformity factor are presented in the range 1≤d/r≤500.
分 类 号:TM15[电气工程—电工理论与新技术]
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