复合相位测量轮廓术研究  

Study on composite phase measuring profilometry

作　　者：岳慧敏[1] 苏显渝[1] 

机构地区：[1]四川大学光电系,成都610064

出　　处：《激光杂志》2006年第1期22-23,共2页Laser Journal

基　　金：国家自然科学基金;中国工程物理研究院联合基金资助(10376018)

摘　　要：最近提出了一种只投影一幅复合光栅就可测量物体三维面形的复合相位测量轮廓术(CPMP),其中复合光栅是由四个不同频率的载频分别调制与其方向垂直的四帧相移条纹并叠加形成的。本文对CPMP在理论及实验上进行了进一步的研究,并将之与相位测量轮廓术(PMP)进行了比较分析。结果表明对于高度连续变化的物体的动态测量,CPMP具有较大的应用前景。这对于复合相位测量轮廓术的进一步应用具有实际指导意义。Recently a composite pattern is reported which consist of four shifting patterns spatially modulated by four different carrier frequencies along orthogonal dimension, perpendicular to the phase dimension. Only one such pattern can recover the depth. This method is called composite phase measuring profilometry （CPMP）. In this paper, we have a further study about CPMP ,and compare CPMP with phase measuring profilometry （PMP） on the aspects of experiments and theories. In this paper the measurement precision and application range of CPMP is illuminated, and it is denoted that CPMP have a big foreground on the dynamic object with no sharp height variation. It is significant for the application of composite phase measuring profilometry.

关 键 词：复合相位测量轮廓术 相位测量轮廓术 复合光栅 

分 类 号：O432.2[机械工程—光学工程] TN247[理学—光学]