外延SR_(0·61)BA_(0·39)NB_2O_6电光薄膜生长及研究  

Growth and Optical Properties of Sr_(0.61)Ba_(0.39)Nb_2O_6 Thin Films by Pulsed Laser Deposition

作　　者：张曰理[1] 马颖[1] 徐丽琴[1] 

机构地区：[1]中山大学光电材料与技术国家重点实验室∥理工学院,广东广州510275

出　　处：《中山大学学报（自然科学版）》2006年第1期33-36,共4页Acta Scientiarum Naturalium Universitatis Sunyatseni

基　　金：国家自然科学基金资助项目(50372085);广东省科技计划资助项目(2004B60303001)

摘　　要：用激光脉冲沉积（PLD）法在MgO（001）衬底上成功地生长、制备出了外延Sr0．61Ba0．39Nb2O6（SBN：61）电光薄膜。对生长制备出的SBN：61电光薄膜用X-射线衍射、扫描电镜（SEM）对其微观结构进行了测量研究；X-射线衍射结果显示：生长在MgO（001）衬底上的SBN：61电光薄膜是外延膜，且SBN：61电光薄膜的（001）取向是沿着MgO衬底表面垂直方向生长的；对生长在（001）MgO衬底上的外延SBN：61电光薄膜在200—900nm光谱范围的透射光谱进行了测量研究，通过对薄膜透射光谱的振荡曲线分析计算得到了SBN：61电光薄膜的光学常数，结果发现外延SBN：61电光薄膜的折射率符合单电子模型并且与SBN：61晶体的折射率非常相近。Epitaxial Sr0.61Ba0.39Nb2O6 （SBN： 61 ） thin films deposited on MgO （100） substrate have been prepared by pulsed laser deposition （PLD）. The structural properties of the thin films were studied by X-ray diffraction. The θ- 2θ scan and Ф- scan on the （551） plane indicate single crystalline layers with the （001） orientation perpendicular to the substrate plane. Optical studies by optical transmittance and spectroscopic ellipsometry （SE） measurements were carried out in the spectral range of 300 - 820 nm, and their optical constants were determined. It is found that the refractive index of the SBN ： 61 films is almost the same as that of SBN： 61 single bulk crystal. In the analysis of the measured spectroscopic ellipsometry spectra, a single electronic oscillator model was adopted to deduce the refractive index of the SBN films.

关 键 词：铌锶酸钡 激光脉冲沉积 光学常数 

分 类 号：O484[理学—固体物理]