针孔点背光技术实验  

Experiments of Point-projection Backlighting Using Pinholes

作　　者：江少恩[1] 黄翼翔[1] 胡昕[1] 于燕宁[1] 于瑞珍[1] 

机构地区：[1]中国工程物理研究院激光聚变研究中心,四川绵阳621900

出　　处：《光子学报》2006年第2期290-293,共4页Acta Photonica Sinica

基　　金：高温高密度等离子体国家实验室基金(51480020103ZS7701);中国工程物理研究院科学技术基金(20030214)资助

摘　　要：在“星光Ⅱ”装置上进行针孔点背光技术的演示实验.利用激光辐照φ50μm的小孔产生的堵孔效应使X光的脉宽缩短,起到类似于短脉冲点背光源的作用.另外利用成像方法,实验演示了由面背光方式获得点背光技术,称之为点针孔背光技术.实验结果表明结合堵孔效应和点背光方式,能获得与点背光同样的结果,这样可以避开点背光对激光器较为苛刻的要求.X-ray backlighting is a powerful tool for diagnosing a large variety of high-density phenomena. In pinhole-assisted point-projection backlighting, pinholes are placed a small distance away from the backlighter source to produce images with large field of view. The techniques of point backlighting using pinhole was experimentally demonstrated on Xingguang-Ⅱ facility （XG-Ⅱ ） with 80 J, 1 ns, 351 nm laser pulse. The pinhole drilled on gold in diameter of 50 μm was irradiated by laser beam and pinhole closure was produced in order that x-ray pulse width was shortened, and then the function similar to point backlighting was obtained. The experimental results shown that the pinhole-assisted point-projection backlighting was feasible.

关 键 词：堵孔效应 针孔点背光 背光技术 

分 类 号：O536[理学—等离子体物理] O434[理学—物理]