酞菁钴薄膜的折射率及吸收特性  

Refractive Index and Absorption of Cobalt Phthalocyanine Thin Film

作　　者：陈启婴[1] 顾冬红[1] 干福熹[1] 

机构地区：[1]中国科学院上海光学精密机械研究所

出　　处：《光学学报》1996年第2期207-211,共5页Acta Optica Sinica

摘　　要：通过真空镀膜法在单晶硅片上制备了酞菁钴（ＣｏＰｃ）薄膜。A cobalt phthalocyanine (CoPc) thin film was obtained by vacuum deposition on a single crystal silicon. The ellipsometric spectra of CoPc thin film have been investigated on a scanning ellipsometer with the analyser and polarizer rotate synchronously. The spectrum is explained with its energy levels.

关 键 词：酞菁钴 薄膜 椭偏光谱 折射率 

分 类 号：TQ613.5[化学工程—精细化工] O484.41[理学—固体物理]