检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
机构地区:[1]北京邮电大学自动化学院电接触科研室,北京100876
出 处:《电子元件与材料》2006年第3期59-62,共4页Electronic Components And Materials
基 金:国家自然基金项目(50277002)
摘 要:分析了便携式通讯终端中PCB镀金电触点的表面磨损情况。连接器簧片与PCB触点之间相对运动造成的磨损加剧了污染,是造成接触失效的主要原因之一。磨损过程为先粘结再擦伤,最后镀金层被磨穿。磨损碎屑被逐渐推到磨损区端部与尘土、摩擦聚合物混合聚集在一起。触点表面磨损的主要方向和磨损区尺寸取决于触点的配合结构。研究结果为建立便携式通讯终端中镀金电触点失效模拟奠定了基础。The wear on the gold plated contacts was analyzed between the spring terminals of connectors and printed circuit board (PCB) in failed portable communication terminals, The wear caused by the relative-motion between the spring and PCB contacts made contamination more worse, and this was one of the main reasons to result in the contact failure. The process of wear was from adhesive to abrasive, the gold plating was worn out at last. The wear debris was pushed to the ends of wear tracks mixed with dust particles and frictional polymer. The direction and amplitude of wear were decided by the mating structures of contacts. The investigation results are the foundation of failure simulation of electrical contacts in portable communication terminals.
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:216.73.216.229