适用于微机母线保护的CT饱和识别新判据  

A Novel Criterion to Identify CT Saturation Suitable for Micro-processor Based Busbar Protection

作　　者：黄小波[1] 王新宇[2] 林湘宁[1] 

机构地区：[1]华中科技大学,武汉430074 [2]湖北省黄石供电公司,黄石435000

出　　处：《湖北电力》2006年第1期23-24,36,共3页Hubei Electric Power

摘　　要：文中提出利用归一化后的差流二次微分值,动态判定是否发生故障发展,有利于进一步提高差动保护的可靠性。仿真结果证实了所提方法的有效性。In this paper, the normalized 2-order differential of the differential current is utilized to dynamically discriminate if an external fault develops to an internal fault. In this case,the reliability of the differential protection can be improved. The simulation results testify the effectiveness of the proposed methods.

关 键 词：差动保护 CT饱和 误动 发展性故障 

分 类 号：TM773[电气工程—电力系统及自动化]