边孔光纤双折射的分析及其测量  

Analysis and measurement of birefringence of side-hole fiber

作　　者：孙崇峰[1] 李智忠[1] 胡永明[1] 杨华勇[1] 张学亮[1] 

机构地区：[1]国防科学技术大学光电科学与工程学院,湖南长沙410072

出　　处：《传感器与微系统》2006年第2期73-75,共3页Transducer and Microsystem Technologies

基　　金：国家自然科学基金资助项目(60377029)

摘　　要：采用有限元分析方法对边孔光纤的双折射进行了理论分析;利用偏振态的周期性变化对边孔光纤的双折射进行了测量,同时,利用边孔光纤B ragg光栅反射光谱对测量结果作了对比分析。测量结果与理论分析偏差小于8%,与光谱实验结果也相吻合,证明了测量方法的可靠性、可行性。所提出的偏振态测量方法具有系统精简、调节环节少、易于实现等优点,对长拍长的光纤是一种实用的双折射测量方法。Finite elements method （FEM） is performed on the birefringence of side-hole fiber （SHF）. The measurement related with the periodical alternation of the polarization state is introduced to measure the hirefringence of SHF,while the reflection spectrum of fiber Bragg grating written in SHF is utilized to analyze the measured birefringence of SHF. The measured result is less than 8 % different from the FEM result, and is accord with the result of spectrum experiment. All results prove that the measurement is reliable and feasible. The measurement proposed possesses the advantages of simpler system, less adjustment and easier to realize, it is a practical method to measure the birefringenee of fiber with longer beat-length.

关 键 词：光纤光学 边孔光纤 双折射 偏振态 

分 类 号：TN253[电子电信—物理电子学]