1/4波片延迟量的相位调制椭偏测量法  

Measurement of the Delay of the Quarter-Wave Plate by Phase-Modulated Ellipsometry

作　　者：赵培[1] 吴福全[1] 郝殿中[1] 王礽[2] 任树锋[1] 

机构地区：[1]曲阜师范大学激光研究所,曲阜273165 [2]曲阜师范大学物理工程学院,曲阜273165

出　　处：《光学学报》2006年第3期379-382,共4页Acta Optica Sinica

摘　　要：利用椭偏测量术中的相位调制椭偏测量原理测量了1/4波片的延迟量。该方法预先对测量光束的偏振态进行调制,以生成随时间变化的光强信号,通过对信号中的谐变成分进行分析而获得待测波片的延迟量。测量了四个波片,其中三个波片的延迟量已经用电光调制法精确测量过,经对比测量的结果符合较好。观察到了和理论相符的云母波片延迟量的振荡现象。实验结果说明这种方法是一种有实际意义的方法。The quarter-wave plate is the key device in the technology of polarized light. So it is important to determinate the retardation of the wave plate. A phase-modulated ellipsometry is described. By modulating the state of polatrzation, intensity signal changing with time is generated from the detector. The delay of the wave plate is obtained by analysing the harmonic component in the signal. The delay of four wave plates is measured, that of three wave plates among them has been precisly measured by electrooptic modulation method. By comparing the results of the two ways, it is found that they have little difference. The oscillation phenomenon in the delay of the isinglass wave plate is found,which had been proved in the reference 3. The experimental results show the phase-modulated ellipsometry is of significance.

关 键 词：光学测量 偏振光学 相位调制 1/4波片 延迟量 

分 类 号：O439[机械工程—光学工程]