提高红外图像均匀性的两级校正技术研究  

Tow-level Correction Technology for Improving IR Image Uniformity

作　　者：胡劲忠[1] 

机构地区：[1]中国科学院上海技术物理研究所,上海200083

出　　处：《半导体光电》2006年第1期83-85,共3页Semiconductor Optoelectronics

摘　　要：凝视红外焦平面成像系统中经常需要根据目标红外辐射强度来修改探测器积分时间,当积分时间变化后,红外图像的均匀性明显变差。探索了一种利用积分时间校正与目前实用性较好的两点温度定标法相结合的焦平面非均匀性校正方案,不仅使红外图像的均匀性得到较大幅度提高,而且在修改积分时间的情况下图像均匀性不受影响。Based on IR radiation intensity of object, integration time of detector is usually corrected in steering focal plane array（FPA） imaging system. Uniformity of IR image is severely degraded when integration time varies. An approach of FPA non-uniformity correction combining integration time correction with two-point temperature correction, which can not only improve uniformity of IR image greatly but make uniformity of IR image immune to integration time, is presented.

关 键 词：焦平面阵列非均匀性校正 两点温度定标 积分时间 

分 类 号：TN216[电子电信—物理电子学]