衍射增强成像原理  

Principles of X-ray diffraction enhanced imaging

作　　者：朱佩平[1] 袁清习[1] 黄万霞[1] 王寯越[1] 舒航[1] 吴自玉[1] 冼鼎昌[1] 

机构地区：[1]中国科学院高能物理研究所同步辐射室

出　　处：《物理学报》2006年第3期1089-1098,共10页Acta Physica Sinica

基　　金：国家自然科学基金重大项目(批准号:10490194);中国科学院高能物理所知识创新经费资助的课题.~~

摘　　要：研究了衍射增强成像过程中X射线与样品和晶体的相互作用,重点分析了小角散射对衍射增强成像的影响,为衍射增强成像方程补充了小角散射噪声项,建立了更普遍的衍射增强成像方程.根据新的衍射增强成像方程,推导出峰位像和腰位像的吸收衬度,消光衬度和折射衬度的数学表达,并讨论了两种合成像(表观吸收像和折射像)的衬度问题.The interactions between X-ray and the sample and crystals were investigated, and the influence of small angle scattering on images was emphatically analyzed in diffraction enhanced imaging in this paper. Not only were the additional noise term caused by small angle scattering introduced, and more general DEI equation established, but also expressions of absorption contrast, extinction contrast and refraction contrast were given for the peak image and the middle slope image. With the new DEI equation, the contrasts of two kinds of resultant images （apparent absorption image and refraction image） were discussed.

关 键 词：相位衬度成像 同步辐射 晶体衍射 X射线照相术 

分 类 号：O436.1[机械工程—光学工程] TB852.1[理学—光学]