晶体三极管输入输出特性曲线测试方法探讨  

Discuss on Testing Method of Characteristic Curve for Input and Output of Crystal Triode

作　　者：王辉[1] 张绍忠[1] 

机构地区：[1]平顶山工学院电气与电子工程系,河南平顶山467001

出　　处：《山西电子技术》2006年第1期84-86,共3页Shanxi Electronic Technology

摘　　要：晶体三极管的输入、输出特性曲线测试,是模拟电子技术最基本的实验之一。掌握正确的测试方法,才能得到正确的结果。分析了不同测试电路可能得到的不同结果,给出了合理的测试电路及符合理论要求的测试结果。The test of characteristic curve for input and output of crystal triode is one of the most basic experiments in simulating electronic technology. The correct result could be made with the correct test method. The paper analyzes the different results possibly gained with different testing circuits, and presents the reasonable testing circuit and the testing result corresponding with the theoretical requirement.

关 键 词：三极管 特性曲线 测试方法 探讨 

分 类 号：TN32[电子电信—物理电子学]