YBa2Cu3Ox超导体的临界电流与显微结构  

Microstructure and Critical Current of YBa_2Cu_3O_x Superconductors

作　　者：王会生 

机构地区：北京理工大学材料中心

出　　处：《北京理工大学学报》1990年第4期52-58,共7页Transactions of Beijing Institute of Technology

摘　　要：用X光结构分析,电子显微镜(SEM)和高分辨率透射电镜(TEM)观察及电、磁测量等手段,系统地研究了烧结YBa_2Cu_3O_x超导体的制备工艺、显微结构与临界电流密度之间的关系,通过讨论分析。The relationships among the conditions of preparation , the microstructure and the critical current density of sintered YBa:Cu3Ox superconductors were studied by X - ray diffraction , SEM , TEM and electrical as well as magnetic means of experimentation . Three kinds of grain boundaries are considered responsible for the detected low Jc in sintered samples .

关 键 词：超导体 临界电流 显微结构 

分 类 号：TM26[一般工业技术—材料科学与工程]