LD内损耗测试新方法  

A New Method to Measure Cavity Loss of LD

作　　者：舒雄文[1] 徐晨[1] 田增霞[1] 沈光地[1] 

机构地区：[1]北京工业大学电子信息与控制工程学院北京市光电子技术实验室,北京100022

出　　处：《光电子．激光》2006年第4期455-457,共3页Journal of Optoelectronics·Laser

基　　金：国家"973"基金资助项目(G200068302);北京市教委基金资助项目(KM200310005009);北京市科委基金资助项目(D0404003040221)

摘　　要：提出了一种新的测试LD内损耗方法,它通过对后腔面镀高反膜,并对前腔面镀不同反射率增透膜,然后根据外微分量子效率倒数1/ηe与1/ln[1/(RfRr)的线性关系(Rf和Rr分别为前后腔面反射率)求出内损耗值。这样可以消除常用的测试LD内损耗方法中因管座反射带来的误差,使误差降低达15%。A new method was put forwards to measure the cavity loss of LD. By depositing high reflection layers on the rear facet and anti-reflection layers on the front facet of the LD,and using the linear relation between 1/ηo. and 1/1n[1/RfRr]（Rf and R, are the front facet and rear facet reflection, respectively）, the method eliminates the error induced by using the usually used way. It makes the value more accurate and reduces the error as much as 15%.

关 键 词：内损耗 外微分量子效率 光功率 

分 类 号：TN247[电子电信—物理电子学]