低压无功补偿装置可靠性问题的试验研究  

Testing and Research of Reliability Problem for LV Reactive Power Compensation Device

作　　者：林秀钦 倪学锋[2] 林浩[2] 

机构地区：[1]佛山南海供电局,广东省佛山市528200 [2]武汉高压研究所,湖北省武汉市430074

出　　处：《电力设备》2006年第4期87-88,共2页Electrical Equipment

摘　　要：目前低压无功补偿装置中所使用的投切开关元件存在因功耗过大,接点易发生过热氧化而损坏的缺陷,影响着低压无功补偿装置的可靠性。因此,减少开关元件的接点功耗是改进无功补偿装置用开关元件质量,提高无功补偿装置运行可靠性的重要内容。文章通过对几种开关元件的接点电压降及功率损耗进行试验、比较及分析,认为WLZ2200型低涌流真空开关接点功率损耗最小,是较适合用作无功补偿装置的开关元件。The reliability problem of existent low voltage reactive power compensation device is due to the over - power consumption of the switch element in the device, which causes overheat and oxidizing of contact and is easy to occur the defect and damages. To reduce the power consumption of switch element of contacts is the important content for improving reliability of reactive power componsation device. Throngh the tests, comparison and analysis of power loss and voltage drop for contacts of some kinds of switch elements, the conclusion is that WLZ2 - 200 vacuum switch is suitable for the switch element in low voltage reactive power compensation device, which is with lower surge current and minimtan contact power loss.

关 键 词：无功补偿装置 开关元件 接点 功耗 

分 类 号：TM714.3[电气工程—电力系统及自动化] TM732