全光纤双窗口高分辨率延时自外差测谱系统  

An All Fiber Self-Heterodyne Speetrum Measurement System with Two-Windows and High Resolution

作　　者：吴铁[1] 惠荣庆[1] 张健平 蒋佩璇 陶尚平 

机构地区：[1]北京邮电学院无线电工程系

出　　处：《北京邮电学院学报》1990年第2期1-6,共6页

摘　　要：本文介绍了一种新型全光纤双窗口高分辨率延时自外差测谱系统,其分辨率为15kHz,灵敏度优于一14.5 dB,应用该系统,我们对1.5μm 和1.3μm 波段带隔离器窄线宽半导体激光器进行了测试,线窄分别为900 kHz 和4 MHz.线宽-功率采积分别为586 kHz·mW 和22 MHz·mW.这些结果和理论计算结果相吻合.A new all fiber self-heterodyne spectium measurement system with two-win- dows and high resolution was reported.The resolution of the system is less than 15 kHz and sensitivity of which is better than-11.5dB.Using it,we measured the linewidth of 1.5μm and 1.3μm waverange narrowing linewidth semiconduc or las(?)s with isola(?)ois,they are 900kHz and 4MHz,respectively.The linewidth- power product of these are 586kHz·mW and 22MHz·mW.These results are in good agrecment with the theoretical estimation as well as the reported experiment results by other authors.

关 键 词：外差 光谱 测谱系统 半导体激光器 

分 类 号：TH744.1[机械工程—光学工程]