光谱分辨的脉冲X射线时间谱仪的研制  

Development of Pulsed X-ray Facility for Wavelength Resolved Fluorescent Lifetime Measurement

作　　者：顾牡[1] 曹顿华[1] 段勇[1] 马晓辉[1] 刘小林[1] 张睿[1] 

机构地区：[1]同济大学波耳固体物理研究所波与材料的微结构重点实验室,上海200092

出　　处：《原子能科学技术》2006年第2期162-167,共6页Atomic Energy Science and Technology

基　　金：国家"863"高科技项目(2002AA324070);教育部高等学校优秀青年教师教学科研奖励计划(教人司(2002)123);上海市教育委员会重点学科研究项目和青年教师项目(01QN18)

摘　　要：通过1台高效率凹面光栅单色仪的研制,在原有脉冲X射线时间谱仪的基础上,开发完成了1套光谱分辨的荧光衰减时间谱仪,其波长和时间分辨率分别可达nm和亚ns量级。由BaF2闪烁晶体的测试结果表明:谱仪可有效进行光谱分辨的发光衰减时间谱测量,加载单色仪后,谱仪的测量效率仅下降2个数量级,达到了设计所预期的指标。利用这一装置,对CeF3晶体光谱分辨的发光衰减时间谱进行了分析。Wi pulsed X-ray basis of origi resolution of th the devel facility for nal ultra-sh the facility opment of a high efficiency concave grating monochromator, a wavelength resolved decay time measurement is made upon the ort pulsed X-ray facility. The wavelength resolution and time are in the scale of nanometer and subnanosecond, respectively. The study of BaF2 shows that the equipment can be applied to measure decay time of different fluorescent components from scintillator quite well. The counting rate for such measurement is only two orders of magnitude lower than for decay time spectra measurement without the monochromator. In addition, the wavelength resolved fluorescent lifetime of CeF3 scintillation crystal is studied bv the facility.

关 键 词：超短脉冲X射线 光谱分辨 衰减时间谱 单光子技术 

分 类 号：TL81[核科学技术—核技术及应用]