蒙特卡罗方法在径迹显微技术中的应用  

Application of Monte Carlo method in PTA technique

作　　者：赵鑫[1] 吴平[1] 

机构地区：[1]北京科技大学应用科学学院物理系,北京100083

出　　处：《物理实验》2006年第4期12-16,共5页Physics Experimentation

基　　金：国家重点基础研究发展规划资助项目(No.G19980601507)

摘　　要：径迹显微技术(PTA)是研究硼的晶界偏聚的行之有效的方法.本文运用蒙特卡罗方法建立了径迹固体探测器上蚀坑带宽度与晶界区域硼富集带实际宽度之间的对应关系.模拟计算结果表明,蚀坑带宽度受实际富集带宽度和晶界平面与磨面夹角2个因素影响.蚀坑带宽度随晶界硼富集带宽度的增加与晶界面与探测器平面夹角的减小而增加,利用本文程序计算结果,可根据蚀坑带宽度和晶界平面与磨面夹角更准确的获得实际富集带宽度.The particulate-tracking autoradiograph （PTA） technique is a powerful tool for studying the behaviors of boron in materials. This article gives a method that can work out the layers of the boundaries from the track of a particles. The simulation results indicate that the breadth of etching pits is affected by the breadth of the boron and the angle between boundaries and the solid detector. The breadth of etching pits will increase with the increasing of the breadth of the boron at austenite grain boundaries, and will decrease with the increasing of the angle. Using the calculation results, the more accurate breadth of etching pits can be obtained from the angle between boundaries and the solid detector.

关 键 词：径迹显微技术 硼 晶界 蒙特卡罗方法 

分 类 号：TG111.2[金属学及工艺—物理冶金]