Microwave Reflectometry for Plasma Density Profile Measurements on HL-2A Tokamak  

作　　者：肖维文 刘泽田 丁玄同 石中兵 Vladimir ZHURAVLEV 

机构地区：[1]Southwestern Institute of Physics, Chengdu 610041, China [2]Kurchatov Institute of Atomic Energy, Moscow, Russia

出　　处：《Plasma Science and Technology》2006年第2期133-136,共4页等离子体科学和技术（英文版）

基　　金：supported by National Natural Science Foundation of China (No. 10335060)

摘　　要：A modulated microwave reflectometry has been successfully developed on HL-2A, which can be used to measure the plasma density profile with time-delay method. This microwave reflectometry has two frequency ranges （26.5 to 40 GHz and 40 to 60 GHz） and it is suitable for measuring the plasma density ranging from 0.8×10^13 cm^-3 to 4.5×10^13 cm^-3. The temporal resolution is i ms and the spatial resolution is about 1 cm. This paper will present the basic principle of the microwave reflectometry, parameters calibration of the equipment and the experimental results on HL-2A tokamak.A modulated microwave reflectometry has been successfully developed on HL-2A, which can be used to measure the plasma density profile with time-delay method. This microwave reflectometry has two frequency ranges （26.5 to 40 GHz and 40 to 60 GHz） and it is suitable for measuring the plasma density ranging from 0.8×10^13 cm^-3 to 4.5×10^13 cm^-3. The temporal resolution is i ms and the spatial resolution is about 1 cm. This paper will present the basic principle of the microwave reflectometry, parameters calibration of the equipment and the experimental results on HL-2A tokamak.

关 键 词：REFLECTOMETRY TIME-DELAY density profile 

分 类 号：O53[理学—等离子体物理]