基于PCI-1711数据采集卡的PTCR伏安特性测试系统  

PTCR Volt-ampere Characteristic Measuring System Based on PCI-1711 Data Acquision Card

作　　者：赵俊[1] 孙毅[1] 罗为[1] 周东祥[1] 

机构地区：[1]华中科技大学电子科学与技术系,湖北武汉430074

出　　处：《仪表技术与传感器》2006年第4期30-31,共2页Instrument Technique and Sensor

摘　　要：利用PC机和基于PCI总线的高速数据采集卡PCI-1711,开发出了新型PTCR伏安特性测试系统。利用采集卡的数字量输出与模拟量输入功能,配以外围接口电路,有效地实现了对电路的控制和对所需数据的采集,同时能对十工位PTCR的伏安特性进行测量。还介绍了时分复用技术在测试系统中的应用。By using computer and high-speed data acquisition card PCI - 1711 which is based on the PCI bus, a new model of measuring system for PTCR＇ s volt-ampere characteristic was built up. Taking use of the card＇s DO/AI function and through the peripheral interface circuit, circuit controlling and data acquisition can be achieved simply and effectively. The application of time division multiplexing in this system was also introduced.

关 键 词：PTCR 伏安特性 数据采集 PCI 时分复用 

分 类 号：TP273[自动化与计算机技术—检测技术与自动化装置]