纳米硫化镍增感的溴化银微晶中光电子衰减特性研究  

Investigation of decay characteristics of photoelectrons in nanoparticales of cubic AgBr sensitized by NiS

作　　者：杨少鹏[1] 郑红芳[1] 李春雷[1] 傅广生[1] 李晓苇[1] 许春华[2] 李金培[2] 

机构地区：[1]河北大学物理科学与技术学院,保定071002 [2]中国科学院理化技术研究所,北京100101

出　　处：《物理学报》2006年第5期2144-2148,共5页Acta Physica Sinica

基　　金：国家自然科学基金(批准号:60478033;10354001;10274017);河北省科学技术研究计划(批准号:05215102);河北省博士基金(批准号:B2003119)资助的课题~~

摘　　要：利用微弱信号的微波吸收相敏检测技术,获得了纳米硫化镍增感的立方体溴化银乳剂中,在增感时间增加的条件下,自由光电子和浅束缚光电子的时间衰减曲线.分析了采用纳米硫化镍进行增感的溴化银乳剂中光生电子随增感时间衰减的过程,讨论了卤化银晶体中电子陷阱对光电子运动行为的影响,分析了电子陷阱效应及陷阱深度同增感时间之间的关系.通过未增感样品与增感样品的衰减曲线对比,得到了在此实验条件下的最佳增感时间为80min.NiS nanoparticales as a sensitizer is added to cubic silver bromide emulsion for the chemical sensitization. The decay curves of free photoelectrons and shallow-trapped electrons in the cubic silver bromide emulsion sensitized by NiS nanoparticales with the continuous increase of sensitization time are measured by the microwave absorption and dielectric spectrum techniques. The courses of decay of photoelectrons in the cubic silver bromide emulsion sensitized by NiS nanoparticales vis sensitization time is analyzed. The influence of electron traps in silver bromide mieroerystals on the behavior of the photoelectrons＇ movement is discussed. The relationships between the effects of electron traps and the depth of traps with sensitization time are analyzed. By comparing the decay characteristics of the unsensitized and the sensitized samples, the optimum sensitization time under the present experimental conditions is 80 min.

关 键 词：纳米硫化镍 衰减时间 电子陷阱 寿命 

分 类 号：TQ571[化学工程—精细化工]