基于嵌入式技术的开关寿命测试仪的设计  

Design of The Switch' s Life-span Test Instrument Based on embedded technology

作　　者：张光建[1] 黄贤英[1] 刘政[1] 杨武[1] 

机构地区：[1]重庆工学院计算机学院

出　　处：《微计算机信息》2006年第05Z期116-117,34,共3页Control & Automation

基　　金：重庆市科技攻关重点项目项目编号:CSTC.2004AA2001-8277-9

摘　　要：为了对开关的寿命进行快速准确地测试,设计了开关寿命测试仪。设计过程如下:首先设计了测试仪的硬件,该硬件使用LPC2138CPU芯片采集开关触头对应的开关量,并与TG12864液晶模块接口输出提示信息;其次设计了判断开关好坏算法和识别坏触头算法;最后根据算法给出了测试仪软件的流程图。应用表明,用这种设计方法实现的测试仪工作可靠、容易使用,适合在开关生产行业推广应用。In order to test the switch＇s life-span rapidly and exactly, a test instrument is designed.The design procedure is followed. Firstly, the hardware of the test instrument is designed, which uses a LPC2138 CPU chip to acquire digital inputs that are corresponding to contacts and to interface with TG1286d LCD module. Secondly, a arithmetic that is used to judge whether a switch is working order and a arithmetic that is used to identify bad contact are designed. Lastly, the softwware flow chart is advanced based on the two arithmetic. Through practice, a test instrument that is implemented with the technique above is reliable and is prone to be used, it is adapted to switch industry.

关 键 词：开关 寿命 测试 LPC2138 

分 类 号：TM56[电气工程—电器]