提高瞬态电流自动测试生成时间效率的方法  

Methods for Enhancing ATPG Efficiency of Dynamic Current Testing

作　　者：张鑫[1] 邝继顺[1] 

机构地区：[1]湖南大学计算机与通信学院,湖南长沙410082

出　　处：《计算机应用研究》2006年第6期82-84,共3页Application Research of Computers

基　　金：国家自然科学基金资助项目(60173042)

摘　　要：瞬态电流测试可以检测一些用电压测试和稳态电流测试不能检测的故障。对每一个故障都进行一次测试生成所花费的时间太多,而且没有必要。针对用瞬态电流测试来检测晶体管开路故障(Stuck-open Fault),研究精简故障数目,提高测试生成效率的方法。通过从靠近电路原始输出端向原始输入端逐渐进行测试生成以及其他一些办法,可以明显提高测试生成的时间效率。模拟实验结果表明,测试生成算法执行时间大约减少了70%。Dynamic current testing can detect some faults that cannot be detected by voltage based test method and quiescent current test method. It takes too much of time to generate a test pattern for each fault, and it is not necessary. This paper focuses on how to reduce the number of stuck-open fauhs detected by dynamic current test technique for enhancing the ATPG efficiency. This can be done in the way that nearer the site of a fault to the primary outputs of the circuit under test, earlier the ATPG for this fault starts. Experimental results show that about 70% of ATPG time is cut down.

关 键 词：测试生成 开路故障 可控制性 CMOS数字电路 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论]