SiO_2包覆纳米CaCO_3的透射电镜表征  

Characterizaiton of SiO_2-cladding Nano-CaCO_3 with Transmission Electron Microscope

作　　者：施用晞[1] 邵磊[2] 陈建峰[2] 

机构地区：[1]北京化工大学分析测试中心,北京100029 [2]北京化工大学纳米材料先进制备技术与应用科学教育部重点实验室,北京100029

出　　处：《分析测试学报》2006年第3期103-105,共3页Journal of Instrumental Analysis

摘　　要：在透射电子显微镜(TEM)电子衍射模式下,用适当孔径的物镜光阑选择非晶态S iO2的衍射区域,拍摄以溶胶-凝胶法制备的S iO2包覆纳米CaCO3的暗场像。与未经包覆S iO2的纳米CaCO3的暗场像作对比,可以看出经过S iO2包覆的纳米CaCO3粒子周围有一白色亮环,从而得到S iO2包覆层的暗场照片。用高分辨方法观察了包覆层与CaCO3粒子间的界面情况。Applying the electron-diffractive mode of transmission electron microscope （TEM）, an objective aperture with a proper diameter was used to select the diffractive area of non-crystal SiO2 for taking the dark field images of SiO2-cladding nano-CaCO3, produced by the sol - gel method. Compared with the dark field image of the non-cladding nano-CaCO3, a white halo could be observed around the SiO2-cladding nano-CaCO3, thus a dark field photo of the SiO2-cladding layer was obtained. The interface between the cladding layer and the CaCO3 particle was observed by a high resolution method.

关 键 词：SiO2-CaCO3 纳米复合材料 透射电子显微镜 暗场像 

分 类 号：O766.1[理学—晶体学]