基于VXI总线的高速数据测试模块硬件设计  

Hardware design of high-speed data test module based on VXI bus

作　　者：周启忠[1] 顾亚平[1] 陈光礻禹 

机构地区：[1]电子科技大学自动化工程学院,四川成都610054

出　　处：《中国测试技术》2006年第3期89-92,共4页CHINA MEASUREMENT & TESTING TECHNOLOGY

摘　　要：VXI高速数字测试模块主要用于数字板卡和数字系统的测试,也具有逻辑分析仪和数字信号发生器的功能。本文讲述了基于VXI总线的高速数据测试模块硬件电路设计。设计包括VXI总线接口电路,高速数据通道(FDC)传输电路,本地数据处理电路和64路可编程I/O电路。充分结合VXI消息基接口的优点,实现了高速数据测试;实时数据比较和故障诊断功能,并对设计过程存在的问题进行讨论。The VXI high-speed data test module is primary used for the test of digital modules and systems.It functions as logic analyzer and signal generator too.This paper described the hardware design of a high-speed data test module based on VXI bus.The device includes circuit of the VXI interfacing, fast data channel, local data processing 64 pins of programmable TTL digital I/ O.Taking advantage of message based device, it realized high-speed data test, real-time comparison and faut dlagnosis.The problems in the process of designing were also discussed.

关 键 词：VXI总线 消息基 字串行协议 双端口RAM 

分 类 号：TP311.12[自动化与计算机技术—计算机软件与理论]