多晶材料X射线衍射无标样定量方法  

X-Ray Standardless Quantitative Analysis Method for Polycrystalline Materials

作　　者：郭常霖[1] 

机构地区：[1]中国科学院上海硅酸盐研究所

出　　处：《无机材料学报》1996年第1期1-8,共8页Journal of Inorganic Materials

基　　金：国家自然科学基金

摘　　要：Ｘ射线物相定量的结果对多晶样品的结构和织构十分敏感．一般的Ｘ射线定量方法都需要在样品中添加标样并均匀混合研磨，因而容易引起很大的误差．近年来，无标样Ｘ射线定量方法得到了很大的发展．无标样定量方法克服了一般有标样Ｘ射线定量方法需要混合研磨和手续烦复的缺点．本文总结了三类ｘ射线衍射无标样定量方法：理论参数计算法、全谱图拟合法以及联立方程法．给出了提高各种无标样法定量精度和可靠性的方法．The results of X-ray quantitative phase analysis is very sensitive to the structure and texture of polycrystalline samples. Commonly, the internal-standards are required to add in and mix uniformly with the sample in X-ray quantitative analysis process. Therefore, it makes the results obtained with large error. Recently, the standardless X-ray quantitative methods are developed dramatically. The complicated process of mixing in the common X-ray quantitative methods is no more to be required in the standardless methods. In this paper, three kinds of standardless quantitative methods: theoretical parameter calculated method, entire pattern fitting method and simultaneous equation method were summarized. The methods for promoting the precision and reliability of these standardless methods were presented.

关 键 词：X射线衍射 无标样定量分析 多晶材料 定量分析 

分 类 号：TB302.5[一般工业技术—材料科学与工程]