辉光放电质谱法分析高纯镓时检出限降低的研究  

STUDY ON THE LOWERING OF DETECTION LIMITS IN GLOW DISCHARGE MS ANALYSIS OF HIGH-PURITY GALLIUM

作　　者：葛爱景[1] 陈刚[1] 

机构地区：[1]中科院上海硅酸盐研究所分析测试中心,200050

出　　处：《理化检验（化学分册）》2006年第6期466-468,共3页Physical Testing and Chemical Analysis(Part B:Chemical Analysis)

摘　　要：研究了用辉光放电质谱法(GDMS)测定高纯镓时,以钙、锡、汞为测定对象,从增加样品的直径、适当降低工作分辨率、增加扫描次数以及增加积分时间等方面进行研究,降低了方法的检出限。Aiming to the lowering of detection limits in glow discharge mass spectrometric analysis of highpurity gallium, taking the determination of calcium, tin and mercury as testing objects, parameter variables such as the increase of the diameter of the sample cubes, the appropriate lowering of working resolving power, the increase of times of scanning and the increase of time of integration etc, were studied in detail and satisfactory results were obtained.

关 键 词：辉光放电质谱法 检出限 高纯镓 杂质测定 

分 类 号：O657.63[理学—分析化学]