电器可靠性寿命试验新方法的探讨  

The Discussin of A New Method for Electrical Apparatus Reliability Life Test

作　　者：翟国富[1] 赵新民[1] 许峰[1] 刘茂恺[1] 

机构地区：[1]哈尔滨工业大学,150001

出　　处：《低压电器》1996年第6期28-30,共3页Low Voltage Apparatus

摘　　要：本文根据现行的电器产品可靠性寿命试验方法存在的问题,提出一种新的可靠性加速寿命试验方法,即多变量寿命预测法.该方法可以缩短试验周期,节省人力物力,提高寿命试验的可靠度,且具有节能、非破坏性等特点.According to the existent questions of reliability life test for the electrical apparatus product, this paper raises a new method for reliability accelerating life test, in other words the more variable life forecast method. This method can shortens test periods, economizes manpower and thingpower, improves the reliability of life test. This method also has the characteristics of saving energy, no destruction and so on.

关 键 词：可靠性 试验 寿命 电器 

分 类 号：TM506[电气工程—电器]