单细胞凝胶电泳法检测研究同步辐射软X射线辐照引起的DNA损伤  

Studies of DNA damage induced by synchrotron radiation soft X-rays using single cell gel electrophoresis

作　　者：顾月华[1] 高恒景[1] 王琦[1] 赵凌[1] 

机构地区：[1]中国科学技术大学生命科学学院,合肥230027

出　　处：《核技术》2006年第7期481-484,共4页Nuclear Techniques

摘　　要：本实验采用单细胞凝胶电泳方法定量检测了不同辐照剂量的同步辐射软X射线对小麦根尖细胞造成的DNA单链损伤。通过测定核DNA的迁移效应表明,在剂量为0—288J·cm-2范围内的软X射线辐照下,有20%—92%的小麦根尖细胞产生了DNA单链的损伤效应,同时DNA的损伤程度也与辐照剂量呈显著正相关。The DNA damage of wheat root tip cells induced by different doses （0-288 J·cm^-2） of synchrotron radiation （SR） soft X-rays was measured by using the single-cell gel electrophoresis （SCGE） technique. The DNA removal in electrophoresis was observed and the results showed that 20%-92% of wheat root tip cells were damaged with the increase of radiation dose, and the DNA damage level （expressed by Tall Moment） was positively correlated with the dose of synchrotron radiation soft X-rays.

关 键 词：单细胞凝胶电泳 软X射线 DNA单链损伤 辐照剂量 

分 类 号：Q343.35[生物学—遗传学]