机械损伤苹果CT值的试验研究  

Study on CT Value of Damaged Apple

作　　者：徐澍敏[1] 于勇[2] 王俊[2] 

机构地区：[1]金华职业技术学院机电工程学院 [2]浙江大学生物系统工程与食品科学学院

出　　处：《农业机械学报》2006年第6期83-85,97,共4页Transactions of the Chinese Society for Agricultural Machinery

基　　金：国家自然科学基金资助项目(项目编号:30170533);教育部新世纪优秀人才支持计划资助项目(项目编号:NCET040544)

摘　　要：以陕西产富士苹果为试验材料,利用X射线电子计算机扫描技术,测定了从不同高度下落苹果CT值的变化规律。试验结果表明,受机械损伤的苹果,在相同的扫描层上,苹果的CT值随贮藏时间增加而降低。且苹果受机械损伤程度越高,苹果的CT值越低。随着扫描层位置与撞击点距离的增加,未受损伤苹果的CT值略有下降;而受机械损伤苹果的CT值明显上升。且随着贮藏时间的变化,苹果CT值随受损伤程度的变化规律有所不同。Picked Fushi apples were used as the experiment objects. The layer of X-ray and computer scan was applied to detect the CT value of apple drop from different heights. On the same scan layer,the CT value of destructive apple decreased with increased of storage time, and the more destruction was made, the lower the CT value was. With the increasing the thickness of scan layer, the CT value of non-destructive apple decreased, while the CT value of destructive apple increased. By changing the storage time, the relation between CT value and destruction is also different.

关 键 词：损伤 苹果 CT 检测 

分 类 号：S661.1[农业科学—果树学] TG115.28[农业科学—园艺学]