ZnSe窗口10.6μm红外增透膜的研究  

Study of 10.6 μm Infrared Antireflection Film on ZnSe Window

作　　者：么艳平[1] 李长江[2] 刘景和[3] 

机构地区：[1]吉林师范大学信息技术学院,吉林四平136000 [2]长春理工大学光学加工中心,吉林长春130022 [3]长春理工大学材料与化工学院,吉林长春130022

出　　处：《光电子．激光》2006年第7期832-835,共4页Journal of Optoelectronics·Laser

基　　金：兵器工业集团公司资助项目(GDZX2003)

摘　　要：设计了ZnSe材料为基底10.6μm红外增透膜。低折射率膜材为BaF2,高折射率膜材为ZnS,计算出它们各自的光学厚度。对ZnSe零件镀膜后的透过率和牢固性等性能测试表明,其光学性能和牢固性皆优。We design a 10.6 μm antireflection film on the ZnSe substrate and analyze the selection to the coating material and the material of evaporation source. We adopt BaF2 as the low-index material and ZnS as the high-index material. In addition, we calculate each layer＇s optical thickness. At last,we test the optical performance and the fastness, and it comes to a conclusion that these performances are excellent.

关 键 词：ZnSe窗口 增透膜 性能测试 

分 类 号：O484.4[理学—固体物理]