基于反符合测量技术的HPGeγ谱仪系统峰康比影响因素研究  

Study on influence factors of the peak-to-Compton ratio of the HPGe γ-ray spectrometer system based on the anti-coincidence measuring technique

作　　者：周春林[1] 黎素芬[1] 徐从学[1] 

机构地区：[1]第二炮兵工程学院102室,陕西西安710025

出　　处：《核电子学与探测技术》2006年第4期429-433,共5页Nuclear Electronics & Detection Technology

摘　　要：介绍了反康普顿HPGeγ谱仪系统的结构组成和井型反符合工作原理,对系统在有无反符合测量条件、源与环探测器相对距离以及源强对峰康比的影响进行了实验研究。实验结果表明,系统在反符合测量条件下,标尺相对位置为46.5cm,源强较弱的情况时,反符合测量技术对系统具有很好的抑制康普顿坪的作用,系统峰康比可达最佳值。This paper introduces the anti-coincidence working principle and composing of the low-background anti-Compton HPGe γ ray spectrometer. It studies the peak-to-Compton ratio under the influence of the system within or without condition of anti-coincidence, the opposite distance between the source and the wreath detector, and the source intensity. Experiment results show that within the condition of anti-coincidence, the staffs of opposite position is 46.5 an and with weaker source intensity, the anti-coincidence measure technique have a great anti-Compton influence on the system, and the peak-to-Compton ratio of system get best value.

关 键 词：低本底 反康普顿 HPGe(谱仪 反符合测量 

分 类 号：TL84[核科学技术—核技术及应用]