Observation of MWCNTs with low-energy electron point source microscope  

作　　者：于洁 柏鑫 张兆祥 张耿民 郭等柱 薛增泉 

机构地区：[1]Key Laboratory for the Physics and Chemistry of Nanodevices and Department of Electronics, Peking University, Beijing 100871, China

出　　处：《Chinese Physics B》2006年第7期1558-1562,共5页中国物理B（英文版）

基　　金：Project supported by the National Natural Science Foundation of China （Grant Nos. 60231010, 60471008, and 60571003） and the National Center for Nanoscience and Technology of China.

摘　　要：The low-energy electron point source （LEEPS） microscope, which creates enlarged projection images with lowenergy field emission electron beams, can be used to observe the projection image of nano-scale samples and to characterize the coherence of the field emission beam. In this paper we report the design and test operation performance of a home-made LEEPS microscope. Multi-walled carbon nanotubes （MWCNTs） synthesized by the CVD method were observed by LEEPS microscope using a conventional tungsten tip, and projection images with the magnification of up to 10^4 was obtained. The resolution of the acquired images is -10 nm. A higher resolution and a larger magnification can be expected when the AC magnetic field inside the equipment is shielded and the vibration of the instrument reduced.The low-energy electron point source （LEEPS） microscope, which creates enlarged projection images with lowenergy field emission electron beams, can be used to observe the projection image of nano-scale samples and to characterize the coherence of the field emission beam. In this paper we report the design and test operation performance of a home-made LEEPS microscope. Multi-walled carbon nanotubes （MWCNTs） synthesized by the CVD method were observed by LEEPS microscope using a conventional tungsten tip, and projection images with the magnification of up to 10^4 was obtained. The resolution of the acquired images is -10 nm. A higher resolution and a larger magnification can be expected when the AC magnetic field inside the equipment is shielded and the vibration of the instrument reduced.

关 键 词：LEEPS microscope field emission carbon nanotube 

分 类 号：TN16[电子电信—物理电子学]