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作 者:叶永红[1] 张家雨[1] 顾培夫[1] 刘旭[1] 唐晋发[1]
机构地区:[1]浙江大学光科系薄膜光学实验室
出 处:《光学学报》1996年第12期1824-1828,共5页Acta Optica Sinica
基 金:国家自然科学基金
摘 要:研究了导H+离子全固态电致变色器件性能退化的内在机制,发现有两个因素导致器件性能退化:在器件褪色过程中,存在于WO3薄膜中的水份将导致OH-在WO3中积累而在其中产生碱性环境,WO3溶于碱性环境而生成钨酸盐;在较高电压作用下H2O电解释放出气体H2和O2而使膜层剥落。通过改进器件结构和改善制备工艺条件,获得了光学密度高达0.5。The internal factors leading to the degradation of proton based all solid state electrochromic device were discussed. Two factors were found for the degradation of EC device: in the bleaching process, water contained in WO 3 thin film would cause OH - ions to accumulate in the film and lead to an alkaline environment, Wo 3 would be solvable in it and form tungstate; Electrolysis leading to the evolution of gas of hydrogen and oxygen would happen in the EC device under high voltage, and finally the film′s peeling off. Through the improvement of the device′s structure and the deposition technique, an good properties and long cycle life all solid state electrochromic device with ΔO.D. of 0.5 and C/B cycles beyond 10 6 was gained.
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