一种新的光栅投影轮廓术  

A Novel Profilometry with Projecting Grating

作　　者：田丰[1] 赵宏[1] 陈文艺 周剑 谭玉山 

机构地区：[1]西安交通大学机械工程学院激光与红外应用研究所

出　　处：《光学学报》1996年第10期1506-1509,共4页Acta Optica Sinica

摘　　要：提出了一种新的光学全场轮廓术。它采用了一种可由计算机控制的、可变空间频率的莫尔条纹投影仪，利用不同空频的两次变精度测量，以适应待测物体形面的突然起伏。在以上理论基础以及一台具体实验装置的配合下。A novel optical whole field profilometry is presented. A new kind of moire fringe projector controlled by computer is used for changing the spacial frequency to adapt the contour of the object to be measured. Besides, a method named “Two Times Measurement with Different Precisions” is proposed in order to measure an object with sudden surface changes. The satisfactory results are obtained.

关 键 词：三维轮廓术 相位 光栅 

分 类 号：TH741.6[机械工程—光学工程]