一种用于三维面形测量的新的去包裹方法  

A NOVEL UNWRAPPING METHOD FOR THREE- DIMENSIONAL PROFILOMETRY

作　　者：田丰[1] 赵宏[1] 陈文艺[1] 周剑[1] 谭玉山[1] 

机构地区：[1]西安交通大学激光红外研究所

出　　处：《光子学报》1996年第9期814-818,共5页Acta Photonica Sinica

摘　　要：本文提出一种可用于三维面形测量的新的去包裹方法。它在原有传统去包裹的基础上提出分割线的方法，能够正确标出应该参与去包裹的象素点及由噪音造成的相位不连续点，因而，在相位图存在噪音及信噪比较低的情况下仍旧可以得到正确且唯一的去包裹相位值。在三维面形测量中，去包裹后的相位值可以真实反映待测物体的面形，因此有很大的理论价值及实际意义。A new method of unwrapping for three-dimensional profilometry is presented in this paper. The way of cut-line is purposed on the basis of traditional methods. It can seperate the true phase points from those uncontinuous caused by noisy,So a correct and unique unwrapped phase map can be obtained despite of existence of noisy and low SNR. This approach has profound practical significance and theory value as a unwrapped phase map can represent the profile of objects to be measured during the 3-D profilometry.

关 键 词：相位去包裹 三维测量 分割 形位测量 

分 类 号：TG83[金属学及工艺—公差测量技术]