Ta_2O_5介质膜性能对液体钽电容器性能的影响  

Influence of Capability of Ta_2O_5 Dielectric Film on Performance of Wet Tantalum Electrolytic Capacitor

作　　者：陆胜[1] 刘仲娥[1] 梁正书 刘凌[1] 阴学清[1] 

机构地区：[1]天津大学电子信息工程学院,天津300072 [2]国营第4326厂,贵州贵阳550018

出　　处：《压电与声光》2006年第4期475-477,480,共4页Piezoelectrics & Acoustooptics

基　　金：国家自然科学基金资助项目(60371028)

摘　　要：叙述了钽电解电容器阳极Ta2O5介质膜的形成过程,分析了电解液闪火与氧化膜击穿的微观过程。利用扫描电子显微镜(SEM)分析了阳极氧化后及产品失效后阳极钽芯表面介质膜的微观结构,并对液钽电容器失效机理进行了探讨。结果表明,介质膜内杂质或缺陷处O2-放电产生的电子发射是电解液闪火和氧化膜击穿的前驱点;在高电场或高温度的作用下,介质膜的场致晶化和热致晶化是液体钽电解电容器失效的主要模式。Forming process of anodic Ta2O5 dielectric film of wet tantalum electrolytic capacitors was analyzed, and the microprocess of electrolyte sparking and the oxide film breakdown were studied. The surface microstructure of anodic tantalum core was analyzed by scanning electron microscope（SEM） , and then analyzed the failure mechanism of wet tantalum capacitor. The results shows that the electron emission caused by discharge of O^2- is the prelude of oxide film breakdown and electrolyte sparking, the crystallization of Ta2O5 dielectric film caused by high electric field and high temperature are the mostly failure mechanism.

关 键 词：Ta2O5介质膜 液体钽电解电容器 失效机理 

分 类 号：TM535.1[电气工程—电器]