基于Measurement Studio的红外探测器动态响应测试系统  

Dynamic Response Test System of Infrared Detector Based on Measurement Studio

作　　者：张伟[1] 刘卫国[1] 

机构地区：[1]西安工业学院光电工程学院,陕西西安710032

出　　处：《测控技术》2006年第8期25-27,共3页Measurement & Control Technology

摘　　要：介绍了基于Measurement Stud io的红外探测器动态响应测试系统的开发,详细介绍了系统软件设计和Measurement Stud io在仪器控制、图形显示方面的使用。该系统可以自动测试不同调制频率下红外探测器的电压响应率和探测率,能够快速准确地完成测试任务,满足了测试要求。The dynamic response test system of infrared detector is developed based on measurement studio. The software design and the application of measurement studio in instrument control and graph display are introduced in detail. The system can be used to measure the voltage responsivity and detectivity of infrared detector at different modulation frequency with rapid speed and high accuracy, it meets the need of measurement.

关 键 词：红外 虚拟仪器 响应率 探测率 

分 类 号：TP311[自动化与计算机技术—计算机软件与理论]