镀锡钢板铬酸盐钝化膜的X射线光电子谱分析  

XPS Analysis of Chromate Passive Film Deposited on Tinplate

作　　者：齐国超[1] 贡雪南[2] 孙德恩[3] 刘春明[1] 

机构地区：[1]东北大学材料与冶金学院,辽宁沈阳110004 [2]宝山钢铁集团公司冷轧部,上海201900 [3]南洋理工大学机械与制造工程学院,新加坡639798

出　　处：《东北大学学报（自然科学版）》2006年第8期875-878,共4页Journal of Northeastern University(Natural Science)

基　　金：辽宁省科技攻关项目(2004221001)

摘　　要：使用X射线光电子能谱(XPS)全元素扫描分析方法对镀锡钢板铬酸盐钝化膜的成分进行了分析研究.结果表明,组成钝化膜的主要元素为Cr,O,Sn和C.通过Ar+溅射对钝化膜进行深度剖析表明,C元素来自于表面的污染而不是膜层本身;Cr和O元素随着Ar+溅射的进行含量逐渐降低,而Sn元素的含量却逐渐增加.溅射约360 s后,Sn元素的含量已达到了80%以上,此时所对应的钝化膜的厚度约为20 nm.通过窄幅扫描对钝化膜的相组成进行了分析,结果表明钝化膜主要由Cr(OH)3,Cr2O3,Sn及其氧化物构成.The composition of chromate passive film deposited on commercial tinplate via a cathodic dichromate treatment was examined with X-ray photoelectron spectroscopy （XPS）. The elements Cr, O and Sn are confirmed in the film together with a certain C as amount of contaminant. The thickness of the passivation layer is found about 20 nm. Narrow scan was carried out for the film＇s phase composition and showed that it consists mainly of Cr（OH）3, Cr2O3, Sn and SnOx. The formation of chromate conversion film involves the hydrolysis, polymerization, and condensation of Cr（OH）3 and Cr2O3.

关 键 词：X射线光电子谱 镀锡钢板 钝化膜 全元素扫描 窄幅扫描 

分 类 号：TG178[金属学及工艺—金属表面处理]