Nd∶GGG激光晶体的同步辐射X射线白光形貌研究  

Study on the synchrotron radiation X-ray white-beam topography of the Nd∶GGG laser crystal

作　　者：孙敦陆[1] 张庆礼[1] 肖敬忠[2] 朱佩平[3] 黄万霞[3] 袁清习[3] 王爱华[1] 殷绍唐[1] 

机构地区：[1]中科院安徽光学精密机械研究所,安徽合肥230031 [2]复旦大学物理系同步辐射研究中心,上海200433 [3]中国科学院高能物理研究所,北京100039

出　　处：《功能材料》2006年第7期1033-1035,共3页Journal of Functional Materials

基　　金：国家自然科学基金资助项目(50472104)

摘　　要：应用同步辐射X射线白光形貌术,对Nd∶GGG晶体中的缺陷进行了研究,观察到晶体中的主要缺陷是生长条纹和位错,对生长条纹产生的机理和位错的类型进行了分析讨论,生长条纹是由于温度波动引起生长率的起伏产生的,确定晶体中的位错有刃型位错、螺旋位错和混合位错。根据生长条纹和位错的生成机制,提出了一些改进生长工艺的措施和方法,为生长质量更高的晶体提供了参考。The Nd ： GGG crystal defects were studied by the synchrotron radiation white-beam topography. The growth stripe and dislocation as main defect in the crystal were observed. The form reason of the growth stripe is that the temperature waving lead to the growth velocity fluctuating. The dislocation sorts have blade type, spiral type and mixed type. According to the form principle of the growth stripe and dislocation, some methods were brought forward in order to decrease the crystal defects and improve the crystal quality.

关 键 词：Nd:GGG晶体 同步辐射 生长条纹 位错 

分 类 号：O77[理学—晶体学]